Beams Document 4381-v2

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Status of the New MI and RR Beam Profiling Measurement Devices

Document #:
Beams-doc-4381-v2
Document type:
Talk
Submitted by:
Randy M Thurman-Keup
Updated by:
Randy M Thurman-Keup
Document Created:
11 Jun 2013, 12:13
Contents Revised:
11 Jun 2013, 15:26
Metadata Revised:
11 Jun 2013, 15:26
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Beams-doc-4381-v1
11 Jun 2013, 12:13
Abstract:
We have undertaken the design of our next generation Ionization Profile Monitor to incorporate a physically smaller 3 bump magnetic containment field, a system for gating the clearing field to select particles from a single batch, an upgraded tunnel preamp, and 16 bit data acquisition system. The desired end result is to still be able to accomplish turn by turn measurements, and extend MicroChannel Plate lifetime. We will present an overview of the new design together with a study of the drift patterns of ionization particles in the active volume of the new IPMs. We also present plans, simulations, and some studies of an electron beam scanner currently being constructed for the Main Injector.
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