Beams Document 495-v2

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Calibrating the Booster Ionization Profile Monitor: Preliminary Summary

Document #:
Beams-doc-495-v2
Document type:
Note
Submitted by:
Panagiotis Spentzouris
Updated by:
Panagiotis Spentzouris
Document Created:
11 Mar 2003, 16:05
Contents Revised:
09 May 2003, 09:48
Metadata Revised:
09 May 2003, 09:48
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Beams-doc-495-v1
11 Mar 2003, 16:05
Abstract:
We have performed a calibration of the Booster Ionization Profile Monitor (IPM) using a new model of the ion dynamics in the detector and independent measurements of the beam width. We obtain the formula sigma_measured = sigma_beam + C1*N*sigma^p1 ; where N is the current in units of 1E12, C1 = (1.13 \pm 0.06) * 10^(-5) m ^ (1-p1)/10^12, and p1=0.615 \pm 0.013
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Keywords:
Booster IPM calibration
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