Beams Document 574-v1

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The Effect of a Reflective Interface along the Input Waveguide on the Q Measurement of a Resonate Cavity.

Document #:
Beams-doc-574-v1
Document type:
Note
Submitted by:
Robert G Scala
Updated by:
Robert G Scala
Document Created:
29 Apr 2003, 10:39
Contents Revised:
29 Apr 2003, 10:39
Metadata Revised:
29 Apr 2003, 10:39
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Abstract:
A method to calculate the error in the measured quality factor due to the presence of a reflective interface along the input waveguide coupled to a resonant cavity is presented and applied to the CKM (Charged Kaons at the Main Injector) Superconducting Radio Frequency (SCRF) cavity quality factor measurement system.
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