| 1337-v2 |
notes from Instrumentation/Beam Physics Meetings |
Nathan Eddy et al. |
DCCTs
Ion Profile Monitor
Intensity Measurements
SyncLite (SL)
Instrumentation/beam Physics
Tune Measurement
Schottky
Sampled Bunch Display (SBD)
FBI
Dampers
Abort Gap Measurements
Flying Wires
|
29 Mar 2005 |
| 1476-v1 |
Tevatron Resistive Wall Current Monitor Circuit Schematic |
James L. Crisp et al. |
Intensity Measurements
Instrumentation
Sampled Bunch Display (SBD)
FBI
|
24 Nov 2004 |
| 1475-v1 |
Tevatron Wall Current Monitors Assignments |
Stephen Pordes |
Intensity Measurements
Instrumentation
Sampled Bunch Display (SBD)
FBI
|
24 Nov 2004 |
| 1462-v1 |
Automated store by store calibration of the SBD and FBI in the Tevatron. |
Timofei B Bolshakov et al. |
DCCTs
Instrumentation
Sampled Bunch Display (SBD)
FBI
|
17 Nov 2004 |
| 1352-v1 |
Proposed TeV SBD and FBI store-by-store calibration |
Timofei B Bolshakov et al. |
Intensity Measurements
Instrumentation
Sampled Bunch Display (SBD)
FBI
|
19 Sep 2004 |
| 1312-v1 |
Pictures of TeV wall-current monitor jumps |
Bob Flora et al. |
Instrumentation
Sampled Bunch Display (SBD)
FBI
|
20 Aug 2004 |
| 1034-v1 |
Wall-current monitor photographs |
James L. Crisp et al. |
Talks
Instrumentation
Sampled Bunch Display (SBD)
FBI
|
22 Feb 2004 |
| 693-v1 |
Tev SBD, FBI calibrations |
Alvin Tollestrup |
Talks
Meetings
Instrumentation
Sampled Bunch Display (SBD)
FBI
Tevatron Group
|
27 Jun 2003 |
| 410-v1 |
FBI Calibration from a Front End |
Tom Meyer |
FBI
|
27 Jan 2003 |
| 244-v1 |
Response of the FBI and SBD in Store 1834 |
Alvin Tollestrup |
Sampled Bunch Display (SBD)
FBI
General
|
13 Dec 2002 |