This document describes a test of the Texas Instruments TLK2501 Transceiver in the Tevatron tunnel. The main purpose of the test was to investigate the sensitivity to radiation-induced single event upsets/latchups, as the device has previously shown a good resistance to total dose. The test device was installed at the foreseen location of the front end electronic for the Tevatron IPMs. Over a period of more than half a year, only a hand-full of events were seen.