Beams Document 5323-v1

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Measurement of Elliptical Beam Emittance in the Transverse Plane

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Adam Watts
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Adam Watts
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08 Feb 2017, 10:30
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08 Feb 2017, 10:30
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08 Feb 2017, 10:30
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Two methods of transverse emittance measurement are derived and discussed in this paper, both using beam profile monitors. Both methods rely on the assumption that the transverse phase space distribution is elliptical; beam that is not in a ring or has been subjected to significant nonlinear forces may not fit this assumption. The first method requiring a single quadrupole and profile monitor, developed by Ross \textit{et. al.}\cite{Ross}, is referred to as the "Quadrupole Scan Method". The second method requires three profile monitors, and is thus known as the "Three Profile Method". Note that both methods are ignoring chromatic effects due to non-zero particle momentum spread, and some correction must be made to the measured beam width to compensate.
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